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On-Line Testing of Transient Faults Affecting Functional Blocks of FCMOS, Domino and FPGA-Implemented Self-Checking Circuits.
Cecilia Metra
Stefano Di Francescantonio
Giuseppe Marrale
Published in:
DFT (2002)
Keyphrases
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high speed
test cases
fault diagnosis
steady state
built in self test
real time
image processing
low cost
fault model
software engineering
signal processing
hardware implementation
digital circuits
delay insensitive
logic synthesis
fpga hardware