Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.
Magali EstradaAntonio CerdeiraBenjamín IñíguezPublished in: Microelectron. Reliab. (2012)
Keyphrases
- thin film
- high density
- electron microscopy
- room temperature
- silicon nitride
- grain size
- field effect transistors
- short circuit
- low density
- multi layer
- user interface
- space charge
- solar cell
- fuel cell
- neural network
- power consumption
- database systems
- circuit design
- image registration
- transfer learning
- integrated circuit
- low power
- data center