Detection and localization of appearance faults in reversible circuits.
Bappaditya MondalChandan BandyopadhyayHafizur RahamanPublished in: ISED (2017)
Keyphrases
- object detection
- markov chain
- fault diagnosis
- detection accuracy
- reliable detection
- activity detection
- automatic detection
- bounding box
- generalized hough transform
- fault detection
- false alarms
- cellular automata
- false positives
- detection algorithm
- appearance model
- high speed
- built in self test
- rao blackwellized particle filter
- neural network
- outdoor scenes
- error detection
- localization algorithm
- asynchronous circuits