Test pattern generation to detect multiple faults in ROBDD based combinational circuits.
Toral ShahAnzhela Yu. MatrosovaVirendra SinghPublished in: IOLTS (2017)
Keyphrases
- multiple faults
- fault diagnosis
- automatic detection
- logic circuits
- high speed
- analog circuits
- asynchronous circuits
- discrete event
- detection method
- logic synthesis
- detection algorithm
- dynamic systems
- circuit design
- lateral inhibition
- databases
- translation invariant
- video sequences
- image processing
- information systems
- artificial intelligence