Rotation-Invariant Wafer Map Pattern Classification With Convolutional Neural Networks.
Seokho KangPublished in: IEEE Access (2020)
Keyphrases
- pattern classification
- rotation invariant
- convolutional neural networks
- rotation invariance
- feature extraction
- nearest neighbor rule
- zernike moments
- texture features
- texture analysis
- feature vectors
- pattern recognition
- texture classification
- scale invariance
- local binary pattern
- thinning algorithm
- gabor filters
- texture descriptors
- dominant orientation
- pattern classification problems
- neural network
- texture images
- data sets
- multiscale
- computer vision
- data mining