SCALE INVARIANCE
Experts
- Tony Lindeberg
- Marc W. Howard
- Li Liu
- Matti Pietikäinen
- Guoying Zhao
- Vincent Andrearczyk
- Adrien Depeursinge
- Vladik Kreinovich
- Slobodan Ilic
- Paul W. Fieguth
- Pengcheng Shi
- Julien Fageot
- Valentin Oreiller
- Dinesh Kumar
- Yong Liu
- Raghuveer M. Rao
- Olaf Ronneberger
- Andreas Uhl
- Chaoyi Zhang
- Hans Burkhardt
- Jianhui Yu
- Jun Zhang
- David M. Chen
- Jie Chen
- Marco Loog
- Dharmendra Sharma
- Radek Grzeszczuk
- Qingmin Liao
- Klaus Hildebrandt
- Yuan Yan Tang
- Seungsin Lee
- Eamonn J. Keogh
- Xiaopeng Xi
- Guojun Lu
- Devis Tuia
- Bernd Girod
- Tiangao Gou
- Vijay Chandrasekhar
- Hua Sun
Venues
- CoRR
- Pattern Recognit.
- ICIP
- ICASSP
- ICPR
- IEEE Trans. Image Process.
- CVPR
- Pattern Recognit. Lett.
- EUSIPCO
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- J. Math. Imaging Vis.
- Multim. Tools Appl.
- ICCV
- Symmetry
- Neurocomputing
- IEEE Trans. Signal Process.
- IJCNN
- NeuroImage
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Signal Process. Lett.
- Entropy
- BMVC
- Inf. Sci.
- AAAI
- ICLR
- Neural Comput.
- Scale-Space
- IEICE Trans. Inf. Syst.
- ICIP (1)
- Pattern Anal. Appl.
- J. Ambient Intell. Humaniz. Comput.
- PLoS Comput. Biol.
- Medical Imaging: Image Processing
- SMC
- ICCV Workshops
- ICRA
- Sensors
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