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Artificial Defocus for Displaying Markers in Microscopy Z-Stacks.
Alessandro Giusti
Pierluigi Taddei
Giorgio Corani
Luca Maria Gambardella
Cristina Magli
Luca Gianaroli
Published in:
IEEE Trans. Vis. Comput. Graph. (2011)
Keyphrases
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image analysis
high resolution
microscopy images
real world
artificial intelligence
image enhancement
high throughput
shape recovery
artificial life
neural network
computer vision
image segmentation
input image
blurred images
electron microscopy
depth from focus