DEPTH FROM FOCUS
Experts
- Trevor Darrell
- Daniel Cremers
- Lorenz K. Müller
- Masatoshi Ishikawa
- Julien N. P. Martel
- In So Kweon
- Piotr Dudek
- Stephen J. Carey
- Ke Xian
- Bernd Jähne
- Neerja Thakkar
- Aydin S. Evren
- Yu-Lin Chang
- Ren Wang
- Jingyi Yu
- Yu-Lun Liu
- Ning-Hsu Wang
- Dong Ku Kim
- Chan-Byoung Chae
- Laura Leal-Taixé
- Tiago Gaspar
- Yu-Hao Huang
- Ethan Weber
- Jan-Phillip Tiesel
- Caner Hazirbas
- Dongsoo Jun
- Yulia Sandamirskaya
- Emre Bor
- Sang Hyun Park
- Zhang Chen
- Juewen Peng
- Irene Parada
- Zijin Wu
- Shree K. Nayar
- Zhiguo Cao
- Masahiro Watanabe
- Xinqing Guo
- Devin Guillory
- Siyuan Li
Venues
- CoRR
- Sensors
- CVPR
- SIGGRAPH Posters
- IEEE Access
- IEEE Trans. Biomed. Eng.
- ICRA
- OFC
- Microelectron. Reliab.
- IEEE SENSORS
- ITCS
- Symmetry
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ICTON
- ICIP
- ISCAS
- VR
- EMBC
- IEEE Trans. Pattern Anal. Mach. Intell.
- Micromachines
- Comput. Graph. Forum
- Image Vis. Comput.
- Inf. Fusion
- ICWSM
- MIPRO
- IEEE Trans Autom. Sci. Eng.
- ICT Express
- NCC
- DSS
- SIGSOFT FSE
- Int. J. Account. Inf. Syst.
- ITQM
- SBP-BRiMS
- Visual Information Processing
- ICLS (1)
- Eur. J. Inf. Syst.
- Electron. Mark.
- J. Sci. Res.
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