Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps.
Fan LiuLei SuMengying FanJian YinZhenzhi HeXiangning LuPublished in: Microelectron. Reliab. (2017)
Keyphrases
- bp algorithm
- defect detection
- back propagation
- printed circuit boards
- automated visual inspection
- bp neural network
- learning rate
- error function
- fault diagnosis
- quality control
- artificial neural networks
- strong robustness
- language model
- neural network
- ant colony algorithm
- convergence speed
- multilayer perceptron
- training algorithm
- fuzzy neural network
- learning algorithm
- pso algorithm
- feed forward
- weight update
- neural nets
- global optimization
- simulated annealing
- evolutionary algorithm
- artificial intelligence