Determination of residual strains of the EMC in PBGA during manufacturing and IR solder reflow processes.
M. Y. TsaiC. W. TingC. Y. HuangYi-Shao LaiPublished in: Microelectron. Reliab. (2011)
Keyphrases
- manufacturing processes
- information retrieval
- semiconductor devices
- printed circuit boards
- failure rate
- text retrieval
- quality control
- information retrieval systems
- manufacturing systems
- process model
- semiconductor manufacturing
- mechanical properties
- manufacturing environment
- information access
- decision making
- search engine
- neural network