Test configurations to enhance the testability of sequential circuits.

S. Lavabre Yves Bertrand Michel Renovell Christian Landrault

Published in: Asian Test Symposium (1995)

Keyphrases

test data generation
e learning
decision trees
built in self test
multiscale
high speed
test cases
data sets
neural network
data mining
computer vision
knowledge base
image processing
test data
delay insensitive