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Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations.
Shi-Xuan Zheng
Chung-Yu Yeh
Kuen-Jong Lee
Chen Wang
Wu-Tung Cheng
Mark Kassab
Janusz Rajski
Sudhakar M. Reddy
Published in:
VTS (2022)
Keyphrases
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input output
accurate estimation
wide range
internal states
data envelopment analysis
fuzzy modeling
noise cancellation
fuzzy model
neural network
single phase
fuzzy neural network
fuzzy inference system
ibm zenterprise
state transition
linear programming
fuzzy logic
learning algorithm