Test Data Compression Using Multi-dimensional Pattern Run-length Codes.
Wang-Dauh TsengLung-Jen LeePublished in: J. Electron. Test. (2010)
Keyphrases
- test data
- run length
- multi dimensional
- run length encoding
- compression rate
- gray level
- test set
- test cases
- training data
- compression ratio
- compression scheme
- data sets
- lossless compression
- image compression
- training set
- video compression
- storage requirements
- texture information
- sample size
- visual quality
- compression algorithm
- data compression
- compressed images
- search based testing
- lossy compression
- data hiding
- pattern matching
- error correction
- training and test data
- texture features
- image segmentation