Rescuing Uncorrectable Fault Patterns in On-Chip Memories through Error Pattern Transformation.
Henry DuweXun JianDaniel PetriskoRakesh KumarPublished in: ISCA (2016)
Keyphrases
- frequent patterns
- candidate patterns
- pattern set
- similar patterns
- pattern mining
- interesting patterns
- sequential patterns
- pattern discovery
- data structure
- graph patterns
- itemsets
- low cost
- condensed representations
- fault diagnosis
- high density
- complex patterns
- pattern matching
- temporal patterns
- fault detection
- associative memory
- pattern extraction
- error rate
- error detection
- high speed
- transformation rules
- single chip
- physical design
- pattern detection
- sequence patterns