Evolutionary recovery of electronic circuits from radiation induced faults.
Adrian StoicaDidier KeymeulenVu DuongRicardo Salem ZebulumIan FergusonTaher DaudTughrul ArslanXin GuoPublished in: IEEE Congress on Evolutionary Computation (2004)
Keyphrases
- electronic circuits
- error detection
- parallel processing
- genetic algorithm
- x ray
- fault diagnosis
- infrared
- fault detection
- graduate school
- evolutionary computation
- normal operation
- output voltage
- test cases
- model based diagnosis
- evolutionary optimization
- learning environment
- recovery algorithm
- fault model
- error correction
- control system
- evolutionary algorithm