A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips.
Ajoy Kumar PalitLei WuKishore K. DuganapalliWalter AnheierJürgen SchlöffelPublished in: Asian Test Symposium (2005)
Keyphrases
- particle filter
- fault model
- random noise
- low signal to noise ratio
- received signal
- signal detection
- noisy environments
- input output
- integrated circuit
- additive noise
- white noise
- signal processing
- lightweight
- noise level
- high speed
- fault injection
- noise model
- signal to noise ratio
- direct sequence spread spectrum
- electron beam
- noise reduction
- frequency domain
- vlsi circuits
- low cost