New Challenges in Delay Testing of Nanometer, Multigigahertz Designs.

T. M. Mak Angela Krstic Kwang-Ting (Tim) Cheng Li-C. Wang

Published in: IEEE Des. Test Comput. (2004)

Keyphrases

lessons learned
key issues
open issues
databases
real world
artificial intelligence
test cases
technical challenges
data sets
software engineering
sufficient conditions
test data