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Procedures for Static Compaction of Test Sequences for Synchronous Sequential Circuits Based on Vector Restoration.
Ruifeng Guo
Irith Pomeranz
Sudhakar M. Reddy
Published in:
DATE (1998)
Keyphrases
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test sequences
video sequences
test cases
bit rate
test generation
mutation testing
image restoration
high speed
image processing
delay insensitive
feature vectors
analog circuits
asynchronous communication
logic synthesis
matching algorithm
three dimensional
power dissipation
database