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Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults.

Kuen-Jong LeeJing-Jou TangTsung-Chu HuangCheng-Liang Tsai
Published in: Asian Test Symposium (1996)
Keyphrases
  • power supply
  • low voltage
  • power system
  • low cost
  • high speed
  • fault diagnosis
  • fully automatic
  • semi automatic
  • image sensor
  • neural network
  • power consumption
  • automatic detection
  • low power
  • fault detection
  • fault model