Reliability Analysis of Logic Circuits.

Mihir R. Choudhury Kartik Mohanram

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)

Keyphrases

reliability analysis
logic circuits
low power
tunnel diode
functional decomposition
gate array
low cost
high speed
condition monitoring
logic synthesis
power consumption
case study
evolutionary algorithm
power dissipation