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Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing.

James W. PomeroyMichael J. UrenBenoit LambertMartin Kuball
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • rf sputtering
  • magnetic field
  • multi channel
  • structuring elements
  • radio frequency
  • test cases