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Reliability-Aware Test Methodology for Detecting Short-Channel Faults in On-Chip Networks.
Biswajit Bhowmik
Santosh Biswas
Jatindra Kumar Deka
Bhargab B. Bhattacharya
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
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built in self test
test cases
social networks
low cost
multi channel
high bandwidth
integrated circuit
high speed
fault diagnosis
cellular networks
complex systems
computer networks
single chip
network design
error detection
network topologies
programmable logic
analog vlsi
real time