A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits.

Ugur Kalay Douglas V. Hall Marek A. Perkowski

Published in: IEEE Trans. Computers (2000)

Keyphrases

test set
test data
test cases
error rate
training set
random selection
evaluation methodology
class distribution
training data
image processing
high speed
training and test data
training and test sets