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gate dielectric stacks.
Piyas Samanta
Chunxiang Zhu
Mansun Chan
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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silicon dioxide
gate dielectrics
leakage current
electrical properties
multiple input
nano scale
machine learning
field effect transistors
neural network
artificial intelligence
wide range
probabilistic model
low voltage
high temperature
space charge