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A built-in self-test and self-diagnosis scheme for embedded SRAM.

Chih-Wea WangChi-Feng WuJin-Fu LiCheng-Wen WuTony TengKevin ChiuHsiao-Ping Lin
Published in: Asian Test Symposium (2000)
Keyphrases
  • detection scheme
  • power consumption
  • embedded systems
  • fault diagnosis
  • data mining
  • genetic algorithm
  • multiresolution
  • model based diagnosis
  • model based reasoning
  • multiple faults
  • built in self test