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A built-in self-test and self-diagnosis scheme for embedded SRAM.
Chih-Wea Wang
Chi-Feng Wu
Jin-Fu Li
Cheng-Wen Wu
Tony Teng
Kevin Chiu
Hsiao-Ping Lin
Published in:
Asian Test Symposium (2000)
Keyphrases
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detection scheme
power consumption
embedded systems
fault diagnosis
data mining
genetic algorithm
multiresolution
model based diagnosis
model based reasoning
multiple faults
built in self test