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An algebraic approach to test generation for sequential circuits.
Antonio Lioy
Enrico Macii
Angelo Raffaele Meo
Matteo Sonza Reorda
Published in:
Great Lakes Symposium on VLSI (1991)
Keyphrases
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test generation
test cases
design automation
symbolic execution
test sequences
high speed
static analysis
software testing
mutation testing
databases
quality assurance
query language
error rate
power consumption
integrity constraints