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Constraint Driven Pin Mapping for Concurrent SOC Testing.
Yu Huang
Nilanjan Mukherjee
Chien-Chung Tsai
Omer Samman
Yahya Zaidan
Yanping Zhang
Wu-Tung Cheng
Sudhakar M. Reddy
Published in:
VLSI Design (2002)
Keyphrases
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concurrent programs
low power
test cases
mutual exclusion
hierarchical reinforcement learning
real time
data sets
databases
neural network
information retrieval
website
data driven
power consumption
test generation