A 10-Gb/s silicon bipolar IC for PRBS testing.

Oliver Kromat Ulrich Langmann Gerhard Hanke William J. Hillery

Published in: IEEE J. Solid State Circuits (1998)

Keyphrases

high density
high speed
field effect transistors
low cost
positive and negative
integrated circuit
databases
test cases
steady state
test generation
transmission electron microscopy