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Concurrent Testing of Digital Circuits for Non-Classical Fault Models: Bridging Faults and n-Detect Test.
Santosh Biswas
Amit Patra
Siddhartha Mukhopadhyay
Published in:
LATW (2006)
Keyphrases
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digital circuits
model based diagnosis
fault models
fault model
test cases
test suite
dynamic systems
information systems
model checking
constraint programming
functional decomposition
multi agent
optimal solution
search space
information management
data flow