Optimal Test Set Design for Analog Circuits.

Linda Milor Alberto L. Sangiovanni-Vincentelli

Published in: ICCAD (1990)

Keyphrases

test set
analog circuits
error rate
training set
test data
training data
machine learning
digital circuits
learning algorithm
test cases
low cost
training and test sets
class distribution
real time
query language
image processing
computer vision
neural network