Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation.

Kazuteru Namba Hideo Ito

Published in: IEICE Trans. Inf. Syst. (2005)

Keyphrases

fault diagnosis
fault detection
fluid model
data sets
database
real time
genetic algorithm
information systems
database systems
optimal solution
lower bound
fuzzy logic
sufficient conditions
failure modes
parallel thinning algorithm
real time embedded systems