A statistical approach for full-chip gate-oxide reliability analysis.

Kaviraj Chopra Cheng Zhuo David T. Blaauw Dennis Sylvester

Published in: ICCAD (2008)

Keyphrases

reliability analysis
high speed
silicon dioxide
leakage current
field effect transistors
low cost
high density
cmos technology
statistical modeling
nm technology
fuel cell
low voltage
data mining
power plant
statistical models
decision support system
object oriented
association rules