Derivation of Minimal Test Sets for Monotonic Logic Circuits.

Ramaswami Dandapani

Published in: IEEE Trans. Computers (1973)

Keyphrases

test set
logic circuits
low power
error rate
training set
training data
tunnel diode
functional decomposition
gate array
test data
logic synthesis
test cases
high speed
data sets
low cost
training and test sets
power consumption
real time
hidden markov models
image processing