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Statistics associated with spatial fault simulation used for evaluating integrated circuit yield enhancement.
Charles H. Stapper
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
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integrated circuit
fault diagnosis
spatial information
space time
spatial and temporal
spatio temporal
spatial data
simulation model
neural network
electron beam
printed circuit boards
spatial distribution
fault detection
mathematical model
real time
x ray
video sequences
image processing
failure modes