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Quality Control Versus Academic Freedom: Walk the line.
Miriam R. B. Abbott
Jami M. Nininger
Peggy Shaw
Published in:
eLearn Mag. (2018)
Keyphrases
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quality control
machine vision
quality assurance
product quality
manufacturing systems
automated visual inspection
manufacturing process
line segments
line drawings
surface inspection
random walk
cooperative
development process
vision system
image processing
academic community
computer vision
neural network