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A unified approach for fault simulation of linear mixed-signal circuits.

Ashok BalivadaHong ZhengNaveena NagiAbhijit ChatterjeeJacob A. Abraham
Published in: J. Electron. Test. (1996)
Keyphrases
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • digital circuits
  • high speed
  • fault diagnosis
  • shift register
  • image sequences
  • video sequences
  • low cost
  • signal processing
  • cmos technology
  • fault models