On comparing functional fault coverage and defect coverage for memory testing.

Von-Kyoung Kim Tom Chen

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)

Keyphrases

test suite
memory usage
memory size
computing power
information systems
random access
test cases
memory requirements
set of test cases
database
databases
software testing
artificial neural networks
multiscale
decision making
real world
low memory
functional analysis
code coverage