Von-Kyoung Kim

Publication Activity (10 Years)

Years Active: 1996-1999
Publications (10 Years): 0

Publications

Von-Kyoung Kim, Tom Chen, Mick Tegethoff
Fault Coverage Estimation for Early Stage of VLSI Design. Great Lakes Symposium on VLSI (1999)
Von-Kyoung Kim, Tom Chen
Assessing Defect Coverage of Memory Testing Algorithms. Great Lakes Symposium on VLSI (1999)
Von-Kyoung Kim, Tom Chen
On comparing functional fault coverage and defect coverage for memory testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (11) (1999)
Von-Kyoung Kim, Tom Chen, Mick Tegethoff
ASIC Manufacturing Test Cost Prediction at Early Design Stage. ITC (1997)
Von-Kyoung Kim, Mick Tegethoff, Tom Chen
ASIC Yield Estimation at Early Design Cycle. ITC (1996)