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Fault Coverage Estimation for Early Stage of VLSI Design.

Von-Kyoung KimTom ChenMick Tegethoff
Published in: Great Lakes Symposium on VLSI (1999)
Keyphrases
  • early stage
  • vlsi design
  • design methodology
  • software engineering
  • real world
  • databases
  • genetic algorithm
  • fuzzy logic
  • model selection