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TI-BIST: a temperature independent analog BIST for switched-capacitor filters.
Luigi Carro
Érika F. Cota
Marcelo Lubaszewski
Yves Bertrand
Florence Azaïs
Michel Renovell
Published in:
Asian Test Symposium (2000)
Keyphrases
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operating conditions
transmission line
fault diagnosis
built in self test
analog circuits
integrated circuit
order statistics
adaptive filtering
analog vlsi