Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing.
Kohei MiyaseKenji NodaHideaki ItoKazumi HatayamaTakashi AikyoYuta YamatoHiroshi FurukawaXiaoqing WenSeiji KajiharaPublished in: IEICE Trans. Inf. Syst. (2011)