Observation of Blue-Light Emission from Tantalum Oxide Films Deposited by Radio-Frequency Magnetron Sputtering.
Kenta MiuraHiroki MiyazakiOsamu HanaizumiPublished in: IEICE Trans. Electron. (2008)
Keyphrases
- radio frequency
- film thickness
- electrical properties
- room temperature
- silicon nitride
- thin film
- silicon dioxide
- rfid reader
- electron microscopy
- frequency band
- leakage current
- refractive index
- phased array
- rfid technology
- magnetic field
- intravascular ultrasound
- relevance feedback
- high frequency
- wavelet transform
- metal oxide
- information retrieval