Reliable detection of CMOS stuck-open faults due to variable internal delays.

Published in: IEICE Electron. Express (2005)

Keyphrases

reliable detection
high speed
fault diagnosis
low cost
low power
power supply
data sets
vlsi circuits
internal and external
power consumption
fault detection
abnormal events
low voltage
multiple faults
analog vlsi
fault model
model based diagnosis
test cases
artificial intelligence