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Variability and Reliability Awareness in the Age of Dark Silicon.

Florian KriebelMuhammad ShafiqueSemeen RehmanJörg HenkelSiddharth Garg
Published in: IEEE Des. Test (2016)
Keyphrases
  • low cost
  • high speed
  • high density
  • highly reliable
  • age related
  • real world
  • failure rate
  • age estimation
  • software product line
  • reliability analysis
  • plasma etching
  • gate dielectrics