Model-based reasoning for electron-beam debugging of VLSI circuits.
Meryem MarzoukiPublished in: J. Electron. Test. (1991)
Keyphrases
- model based reasoning
- vlsi circuits
- electron beam
- model based diagnosis
- x ray
- integrated circuit
- fault localization
- diagnostic knowledge
- semiconductor devices
- dynamic systems
- design parameters
- low power
- case based reasoning
- digital circuits
- mixed signal
- real time
- electron beam lithography
- constraint programming
- three dimensional