Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk.
Rahul KunduR. D. (Shawn) BlantonPublished in: ITC (2003)
Keyphrases
- test generation
- logic circuits
- power dissipation
- low power
- test cases
- design automation
- functional decomposition
- symbolic execution
- static analysis
- software testing
- tunnel diode
- power consumption
- high speed
- low cost
- database
- quality assurance
- logic synthesis
- open source
- xml documents
- relational databases
- case study
- artificial intelligence