New techniques for selecting test frequencies for linear analog circuits.

Mohand Bentobache Ahcène Bounceur Reinhardt Euler Yann Kieffer Salvador Mir

Published in: VLSI-SoC (2013)

Keyphrases

analog circuits
test data
digital circuits
wavelet packet transform
statistical tests
neural network
machine learning
artificial intelligence
image processing
pattern recognition
fault diagnosis
dynamical systems