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New techniques for selecting test frequencies for linear analog circuits.
Mohand Bentobache
Ahcène Bounceur
Reinhardt Euler
Yann Kieffer
Salvador Mir
Published in:
VLSI-SoC (2013)
Keyphrases
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analog circuits
test data
digital circuits
wavelet packet transform
statistical tests
neural network
machine learning
artificial intelligence
image processing
pattern recognition
fault diagnosis
dynamical systems