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In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin film.
Sho Muroga
Y. Shimada
Yasushi Endo
Satoshi Tanaka
Masahiro Yamaguchi
Naoya Azuma
Makoto Nagata
Motoki Murakami
Kazuaki Hori
Satoru Takahashi
Published in:
EMC Compo (2013)
Keyphrases
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thin film
high density
film thickness
short circuit
low cost
grain size
high speed
white light interferometry
expert systems
multi layer
electron microscopy
solar cell
room temperature