A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique.
Wei HeYigang HeBing LiChaolong ZhangPublished in: IEEE Access (2020)
Keyphrases
- fault diagnosis
- analog circuits
- naive bayes
- decision trees
- neural network
- classification accuracy
- expert systems
- text classification
- text categorization
- fault detection
- naive bayes classifier
- multiscale
- bayesian networks
- logistic regression
- training data
- feature extraction and selection
- digital circuits
- bayesian network classifiers
- fuzzy logic
- augmented naive bayes
- multiresolution
- similarity measure
- artificial intelligence