Wei He

Publication Activity (10 Years)

Years Active: 2016-2020
Publications (10 Years): 8

Top Topics

Fault Diagnosis

Feature Extraction And Selection

Analog Circuits

Top Venues

IEEE Trans. Instrum. Meas.

J. Electron. Test.

Publications

Tongtong Cheng, Yigang He, Wei He, Luqiang Shi, Yongbo Sui, Yuan Huang
Low Complexity Channel Prediction Using TFOS-ELM Method for Massive MIMO Systems. IEEE Access 8 (2020)
Yuan Huang, Yigang He, Wei He, Luqiang Shi, Tongtong Cheng, Yongbo Sui
Channel Estimation in Massive MIMO Systems Based on Generalized Block Adaptive Matching Pursuit Algorithm. IEEE Wirel. Commun. Lett. 9 (12) (2020)
Wei He, Yigang He, Bing Li
Generative Adversarial Networks With Comprehensive Wavelet Feature for Fault Diagnosis of Analog Circuits. IEEE Trans. Instrum. Meas. 69 (9) (2020)
Wei He, Yigang He, Bing Li, Chaolong Zhang
A Naive-Bayes-Based Fault Diagnosis Approach for Analog Circuit by Using Image-Oriented Feature Extraction and Selection Technique. IEEE Access 8 (2020)
Yuan Huang, Yigang He, Luqiang Shi, Tongtong Cheng, Yongbo Sui, Wei He
A Sparsity-Based Adaptive Channel Estimation Algorithm for Massive MIMO Wireless Powered Communication Networks. IEEE Access 7 (2019)
Luqiang Shi, Yigang He, Qiwu Luo, Wei He, Bing Li
Tilt Angle On-Line Prognosis by Using Improved Sparse LSSVR and Dynamic Sliding Window. IEEE Trans. Instrum. Meas. 67 (2) (2018)
Wei He, Yigang He, Bing Li, Chaolong Zhang
Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE. Entropy 20 (8) (2018)
Chaolong Zhang, Yigang He, Lifen Yuan, Wei He, Sheng Xiang, Zhigang Li
A Novel Approach for Diagnosis of Analog Circuit Fault by Using GMKL-SVM and PSO. J. Electron. Test. 32 (5) (2016)